Formation of I2-type basal-plane stacking faults in In0.25Ga0.75N multiple quantum wells grown on a ( 101 ̄1) semipolar GaN template

نویسندگان

  • Yueliang Li
  • Haoyuan Qi
  • Tobias Meisch
  • Matthias Hocker
  • Klaus Thonke
  • Ferdinand Scholz
  • Ute Kaiser
چکیده

GaN-based light emitting diodes using p-type trench structure for improving internal quantum efficiency Appl.

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تاریخ انتشار 2017